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Zhurnal Tekhnicheskoi Fiziki, 2014, Volume 84, Issue 2, Pages 76–82 (Mi jtf8007)  
This article is cited in 19 scientific papers (total in 19 papers)

Physics of nanostructures

Magnetic impedance of structured film meanders in the presence of magnetic micro- and nanoparticles

A. A. Yuvchenkoa, V. N. Lepalovskija, V. O. Vasil'kovskiia, A. P. Safronovab, S. O. Volchkova, G. V. Kurlyandskayaac

a Ural Federal University named after the First President of Russia B. N. Yeltsin, Ekaterinburg
b Institute of Electrophysics, Ural Branch, Russian Academy of Sciences, Ekaterinburg
c University of the Basque Country
Full-text PDF (628 kB) Citations (19)
Abstract: The magnetic impedance (MI) of film elements in the form of meanders with a [Fe19Ni81]/Cu]$_4$/Fe19Ni81/Cu/[Fe19Ni81/Cu]$_4$/Fe19Ni81 layered structure and variable geometry is studied. For the best meanders (having a maximal MI of up to 125% and an MI maximal sensitivity of about 30%/Oe), the influence of stray magnetic fields is determined. The stray fields are produced by spherical iron particles 500 $\mu$m in diameter and ferrofluids containing iron oxide nanoparticles. The feasibility of detecting intricately configured stray fields from a set of ferromagnetic spheres arranged on the surface of an MI element is demonstrated. The sensitivity of film meander MI elements to nonuniform external magnetic fields is simulated. The results of this work may be helpful in developing special-purpose magnetic sensors intended for micropositioning, nondestructive testing, and biomagnetic detection.
Received: 12.03.2013
English version:
Technical Physics, 2014, Volume 59, Issue 2, Pages 230–236
DOI: https://doi.org/10.1134/S1063784214020248
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. A. Yuvchenko, V. N. Lepalovskij, V. O. Vasil'kovskii, A. P. Safronov, S. O. Volchkov, G. V. Kurlyandskaya, “Magnetic impedance of structured film meanders in the presence of magnetic micro- and nanoparticles”, Zhurnal Tekhnicheskoi Fiziki, 84:2 (2014), 76–82; Tech. Phys., 59:2 (2014), 230–236
Citation in format AMSBIB
\Bibitem{YuvLepVas14}
\by A.~A.~Yuvchenko, V.~N.~Lepalovskij, V.~O.~Vasil'kovskii, A.~P.~Safronov, S.~O.~Volchkov, G.~V.~Kurlyandskaya
\paper Magnetic impedance of structured film meanders in the presence of magnetic micro- and nanoparticles
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2014
\vol 84
\issue 2
\pages 76--82
\mathnet{http://mi.mathnet.ru/jtf8007}
\elib{https://elibrary.ru/item.asp?id=21310976}
\transl
\jour Tech. Phys.
\yr 2014
\vol 59
\issue 2
\pages 230--236
\crossref{https://doi.org/10.1134/S1063784214020248}
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    • This publication is cited in the following 19 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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