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Zhurnal Tekhnicheskoi Fiziki, 2013, Volume 83, Issue 9, Pages 134–142
(Mi jtf8546)
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This article is cited in 7 scientific papers (total in 7 papers)
Experimental instruments and technique
Investigation of supersmooth optical surfaces and multilayer elements using soft X-ray radiation
M. M. Barysheva, Yu. A. Vainer, B. A. Gribkov, M. V. Zorina, A. E. Pestov, N. N. Salashchenko, N. I. Chkhalo, A. V. Shcherbakov Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
Abstract:
The aim of this work is application of soft X-ray diffuse scattering for certification of diffractiongrade optical elements and their substrates at a working wavelength. A device is suggested that allows certification under laboratory conditions owing to a dynamic range approaching that of synchrotron radiation sources. Experimental data are compared with data of alternative methods.
Received: 16.11.2012
Citation:
M. M. Barysheva, Yu. A. Vainer, B. A. Gribkov, M. V. Zorina, A. E. Pestov, N. N. Salashchenko, N. I. Chkhalo, A. V. Shcherbakov, “Investigation of supersmooth optical surfaces and multilayer elements using soft X-ray radiation”, Zhurnal Tekhnicheskoi Fiziki, 83:9 (2013), 134–142; Tech. Phys., 58:9 (2013), 1371–1379
Linking options:
https://www.mathnet.ru/eng/jtf8546 https://www.mathnet.ru/eng/jtf/v83/i9/p134
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