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Zhurnal Tekhnicheskoi Fiziki, 2025, Volume 95, Issue 10, Pages 2012–2020
DOI: https://doi.org/10.61011/JTF.2025.10.61354.462-24
(Mi jtf8585)
 

Plasma

Three-electrode micro-discharge device: ions injection from the stationary townsend discharge

L. M. Portsel', Yu. A. Astrov, A. N. Lodygin, E. V. Beregulin

Ioffe Institute, St. Petersburg
Abstract: The using a three-electrode system “semiconductor-gas discharge” as a microreactor for surface plasma chemical treatment of semiconductor materials was studied. The system consists of two discharge gaps separated by a metal grid, which is the common electrode. A stationary self-sustained Townsend discharge is formed in the first gap. Charged particles, passing through the grid cells, excite a non-self-standing discharge in the second gap. Treatment of the sample surface occurs as a result of interaction with the discharge products. The experiments were carried out with an argon-filled system, and GaAs was used as a sample. The change of surface properties was determined by the method of spectral ellipsometry. It is shown that irradiation of the semiconductor with argon ions Ar$^+$ result in the surface cleaning from the oxide layer and the formation of a modified near-surface layer 5–20 microns thick. The composition of the layer is a mixture of crystalline and amorphous GaAs.
Keywords: gas discharge, semiconductor GaAs, surface modification, ellipsometry.
Received: 18.12.2024
Revised: 18.03.2025
Accepted: 07.04.2025
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: L. M. Portsel', Yu. A. Astrov, A. N. Lodygin, E. V. Beregulin, “Three-electrode micro-discharge device: ions injection from the stationary townsend discharge”, Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025), 2012–2020
Citation in format AMSBIB
\Bibitem{PorAstLod25}
\by L.~M.~Portsel', Yu.~A.~Astrov, A.~N.~Lodygin, E.~V.~Beregulin
\paper Three-electrode micro-discharge device: ions injection from the stationary townsend discharge
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2025
\vol 95
\issue 10
\pages 2012--2020
\mathnet{http://mi.mathnet.ru/jtf8585}
\crossref{https://doi.org/10.61011/JTF.2025.10.61354.462-24}
\elib{https://elibrary.ru/item.asp?id=83895016}
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