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This article is cited in 11 scientific papers (total in 11 papers)
Optics
Prism excitation of leaky modes of thin films
A. B. Sotskia, L. M. Steingartb, J. H. Jacksonb, P. Ya. Chudakovskiia, L. I. Sotskayac a Mogilev State A. A. Kuleshov University
b Metricon Corporation, 08534 Pennington, New Jersey, USA
c Belarusian-Russian University
Abstract:
The conditions for prism excitation of leaky modes of thin dielectric films are investigated theoretically and experimentally. The possibility of solving the inverse optical problem on reconstruction of parameters of the films guiding the leaky modes of various types are analyzed.
Received: 21.09.2012
Citation:
A. B. Sotski, L. M. Steingart, J. H. Jackson, P. Ya. Chudakovskii, L. I. Sotskaya, “Prism excitation of leaky modes of thin films”, Zhurnal Tekhnicheskoi Fiziki, 83:11 (2013), 105–115; Tech. Phys., 58:11 (2013), 1651–1660
Linking options:
https://www.mathnet.ru/eng/jtf8621 https://www.mathnet.ru/eng/jtf/v83/i11/p105
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