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Zhurnal Tekhnicheskoi Fiziki, 2013, Volume 83, Issue 12, Pages 128–133 (Mi jtf8648)  

This article is cited in 38 scientific papers (total in 38 papers)

Physical electronics

Memristor effect on bundles of vertically aligned carbon nanotubes tested by scanning tunnel microscopy

O. A. Ageev, Yu. F. Blinov, O. I. Il'in, A. S. Kolomiytsev, B. G. Konoplev, M. V. Rubashkina, V. A. Smirnov, A. A. Fedotov

Southern Federal University, Rostov-on-Don
Abstract: We report on the results of experimental study of an array of vertically aligned carbon nanotubes (VA CNTs) by scanning tunnel microscopy (STM). It is shown that upon the application of an external electric field to the STM probe/VA CNT system, individual VA CNTs are combined into bundles whose diameter depends on the radius of the tip of the STM probe. The memristor effect in VA CNTs is detected. For the VA CNT array under investigation, the resistivity ratio in the low- and high-resistance states at a voltage of 180 mV is 28. The results can be used in the development of structures and technological processes for designing nanoelectronics devices based on VA CNT arrays, including elements of ultrahigh-access memory cells for vacuum microelectronics devices.
Received: 27.02.2013
English version:
Technical Physics, 2013, Volume 58, Issue 12, Pages 1831–1836
DOI: https://doi.org/10.1134/S1063784213120025
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: O. A. Ageev, Yu. F. Blinov, O. I. Il'in, A. S. Kolomiytsev, B. G. Konoplev, M. V. Rubashkina, V. A. Smirnov, A. A. Fedotov, “Memristor effect on bundles of vertically aligned carbon nanotubes tested by scanning tunnel microscopy”, Zhurnal Tekhnicheskoi Fiziki, 83:12 (2013), 128–133; Tech. Phys., 58:12 (2013), 1831–1836
Citation in format AMSBIB
\Bibitem{AgeBliIli13}
\by O.~A.~Ageev, Yu.~F.~Blinov, O.~I.~Il'in, A.~S.~Kolomiytsev, B.~G.~Konoplev, M.~V.~Rubashkina, V.~A.~Smirnov, A.~A.~Fedotov
\paper Memristor effect on bundles of vertically aligned carbon nanotubes tested by scanning tunnel microscopy
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2013
\vol 83
\issue 12
\pages 128--133
\mathnet{http://mi.mathnet.ru/jtf8648}
\elib{https://elibrary.ru/item.asp?id=20326074}
\transl
\jour Tech. Phys.
\yr 2013
\vol 58
\issue 12
\pages 1831--1836
\crossref{https://doi.org/10.1134/S1063784213120025}
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  • https://www.mathnet.ru/eng/jtf/v83/i12/p128
  • This publication is cited in the following 38 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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