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Zhurnal Tekhnicheskoi Fiziki, 2012, Volume 82, Issue 6, Pages 132–134
(Mi jtf8855)
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This article is cited in 1 scientific paper (total in 1 paper)
Experimental Instruments and Methods
Microdetermination of silicon dioxide on the surface by sensors based on perfluorinated proton-conducting membranes
S. E. Nikitina, E. I. Terukova, S. V. Timofeevb, N. K. Manabaevc a Ioffe Institute, St. Petersburg
b "Plastpolymer" Joint Stock Company, St. Petersburg
c al-Farabi Kazakh National university, Almaty
Abstract:
A microdetermination method of silicon dioxide on the silicon surface is studied. In this method, a thin SiO$_2$ layer is dissolved in an aqueous solution of hydrofluoric acid and then the resulting solution is analyzed with sensors based on perfluorinated proton-conducting membranes. Quantitative determination of silicon dioxide remaining on the silicon surface in a quantity as low as 1 $\times$ 10$^{-6}$ mol is demonstrated to be feasible.
Received: 16.08.2011
Citation:
S. E. Nikitin, E. I. Terukov, S. V. Timofeev, N. K. Manabaev, “Microdetermination of silicon dioxide on the surface by sensors based on perfluorinated proton-conducting membranes”, Zhurnal Tekhnicheskoi Fiziki, 82:6 (2012), 132–134; Tech. Phys., 57:6 (2012), 865–867
Linking options:
https://www.mathnet.ru/eng/jtf8855 https://www.mathnet.ru/eng/jtf/v82/i6/p132
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