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Zhurnal Tekhnicheskoi Fiziki, 2012, Volume 82, Issue 8, Pages 110–113
(Mi jtf8904)
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This article is cited in 22 scientific papers (total in 22 papers)
Surfaces, Electron and Ion Emission
Optical properties of TiÎ$_2$–MnO$_2$ thin films prepared by electron-beam evaporation
V. V. Brus, Z. D. Kovalyuk, P. D. Mar'yanchuk Chernivtsi National University named after Yuriy Fedkovych
Abstract:
The optical constants and thickness of TiÎ$_2$–MnO$_2$ films (with MnO$_2$ concentration of 0, 1, and 5%) prepared by electron-beam evaporation are determined. A considerable dependence of the optical properties of thin TiO$_2$ films on the manganese concentration is observed. It is found that thin films are indirect gap semiconductors with gap width $E_g$ = 3.43 eV (TiO$_2$), 2.89 eV (TiÎ$_2$–MnO$_2$ (1%)), and 2.73 eV (TiÎ$_2$–MnO$_2$ (5%)).
Received: 21.04.2011
Citation:
V. V. Brus, Z. D. Kovalyuk, P. D. Mar'yanchuk, “Optical properties of TiÎ$_2$–MnO$_2$ thin films prepared by electron-beam evaporation”, Zhurnal Tekhnicheskoi Fiziki, 82:8 (2012), 110–113; Tech. Phys., 57:8 (2012), 1148–1151
Linking options:
https://www.mathnet.ru/eng/jtf8904 https://www.mathnet.ru/eng/jtf/v82/i8/p110
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