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This article is cited in 1 scientific paper (total in 1 paper)
Experimental Instruments and Methods
Methods for estimating the precipitate thickness on the surface of cooled optical elements in vacuum with contamination sources
E. V. Kalashnikov, S. N. Kalashnikova Research Institute for Complex Testing of Optoelectronic Devices and Systems, Sosnovy Bor, Leningrad region
Abstract:
We describe a simple method for estimating contamination (thickness and growth rate of precipitate layers) on the surfaces of elements of an optical system operating in vacuum. Experimental results of physical simulation of contamination of on-board optical elements of a spacecraft orbiting with its own external atmosphere are reported and compared with calculated values. The results of this research can be used in cryostatting of optical elements in the residual atmosphere of a vacuum chamber.
Received: 27.12.2011
Citation:
E. V. Kalashnikov, S. N. Kalashnikova, “Methods for estimating the precipitate thickness on the surface of cooled optical elements in vacuum with contamination sources”, Zhurnal Tekhnicheskoi Fiziki, 82:11 (2012), 111–115; Tech. Phys., 57:11 (2012), 1574–1578
Linking options:
https://www.mathnet.ru/eng/jtf8975 https://www.mathnet.ru/eng/jtf/v82/i11/p111
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