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Zhurnal Tekhnicheskoi Fiziki, 2011, Volume 81, Issue 11, Pages 125–129 (Mi jtf9293)  
This article is cited in 3 scientific papers (total in 3 papers)

Surfaces, Electron and Ion Emission

Properties of low-refractive-index films obtained by the close-spaced vapor transport technique under the sublimation of graphite in a quasi-closed volume

N. V. Sopinskii, V. S. Khomchenko, O. S. Litvin, A. K. Savin, N. A. Semenenko, A. A. Evtukh, V. P. Sobolevskii, G. P. Olkhovik

Institute of Semiconductor Physics NAS, Kiev
Full-text PDF (337 kB) Citations (3)
Abstract: The properties of low-refractive-index carbon films obtained by close-spaced vapor transport at graphite sublimation are studied. The optical properties of the films are investigated by monochromatic multiple-angle ellipsometry, and their morphology is examined by AFM. It is found that the films have a columnar structure with a background surface roughness of about 1 nm. In addition, the surface of the film contains islands up to 50 nm in height with a footprint of $\approx$ 200 nm. A low-refractive-index carbon film deposited by close-spaced vapor transport on silicon tips is found to decrease the field emission threshold and drastically raise the current.
Received: 28.02.2011
English version:
Technical Physics, 2011, Volume 56, Issue 11, Pages 1665–1669
DOI: https://doi.org/10.1134/S1063784211110259
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: N. V. Sopinskii, V. S. Khomchenko, O. S. Litvin, A. K. Savin, N. A. Semenenko, A. A. Evtukh, V. P. Sobolevskii, G. P. Olkhovik, “Properties of low-refractive-index films obtained by the close-spaced vapor transport technique under the sublimation of graphite in a quasi-closed volume”, Zhurnal Tekhnicheskoi Fiziki, 81:11 (2011), 125–129; Tech. Phys., 56:11 (2011), 1665–1669
Citation in format AMSBIB
\Bibitem{SopKhoLit11}
\by N.~V.~Sopinskii, V.~S.~Khomchenko, O.~S.~Litvin, A.~K.~Savin, N.~A.~Semenenko, A.~A.~Evtukh, V.~P.~Sobolevskii, G.~P.~Olkhovik
\paper Properties of low-refractive-index films obtained by the close-spaced vapor transport technique under the sublimation of graphite in a quasi-closed volume
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2011
\vol 81
\issue 11
\pages 125--129
\mathnet{http://mi.mathnet.ru/jtf9293}
\elib{https://elibrary.ru/item.asp?id=20325344}
\transl
\jour Tech. Phys.
\yr 2011
\vol 56
\issue 11
\pages 1665--1669
\crossref{https://doi.org/10.1134/S1063784211110259}
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    • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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