A. V. Stanchik, V. A. Chumak, V. F. Gremenok, S. M. Baraishuk, “A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films”, Mendeleev Commun., 31:5 (2021), 726

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Mendeleev Communications, 2021, Volume 31, Issue 5, Pages 726–727
DOI: https://doi.org/10.1016/j.mencom.2021.09.045 (Mi mendc1037)

This article is cited in 2 scientific papers (total in 2 papers)

Communications

A low-temperature X-ray diffraction study of the Cu₂ZnSnSe₄ thin films

A. V. Stanchik^a, V. A. Chumak^a, V. F. Gremenok^a, S. M. Baraishuk^b

^a Scientific and Practical Materials Research Center, National Academy of Sciences of Belarus, Minsk, Belarus
^b Department of Practical Training of Students, Belorussian State Technical Agrarian University, Minsk, Belarus

Full-text PDF (786 kB) Citations (2)

DOI: https://doi.org/10.1016/j.mencom.2021.09.045

$Graphic abstract: A low-temperature X-ray diffraction study of the Cu<sub>2</sub>ZnSnSe<sub>4</sub> thin films$

Abstract: Low-temperature XRD measurements were performed to confirm the phase composition and structural parameters of the electrochemically deposited Cu₂ZnSnSe₄ thin films on flexible metal substrates.

Keywords: electrochemical deposition, flexible metal substrates, thin films, Cu₂ZnSnSe₄, low-temperature X-ray studies.

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Document Type: Article

Language: English

Citation: A. V. Stanchik, V. A. Chumak, V. F. Gremenok, S. M. Baraishuk, “A low-temperature X-ray diffraction study of the Cu₂ZnSnSe₄ thin films”, Mendeleev Commun., 31:5 (2021), 726–727

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https://www.mathnet.ru/eng/mendc1037

https://www.mathnet.ru/eng/mendc/v31/i5/p726

This publication is cited in the following 2 articles:

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