Deep machine learning for STEM image analysis

The universal, user-friendly online iOk Platform for automatic recognition of any type of objects in images based on deep machine learning is presented. Services aggregated in the iOk Platform significantly reduce the time spent on quantitative image analysis, decrease the influence of the subjective factor and increase the accuracy of the analysis by expanding the set of data that can be analyzed automatically. It is shown how the services can be used to analyze scanning transmission electron microscopy images obtained in heterogeneous catalysis studies, allowing for measurements of thousands of objects in an image, as well as simultaneous analysis of objects of different types, namely: nanoparticles and single sites.