O. V. Kotova, S. V. Eliseeva, E. V. Perevedentseva, T. F. Limonova, R. A. Baigeldieva, A. G. Vitukhnovsky, N. P. Kuzmina, “The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy”, Mendeleev Commun., 14:4 (2004), 155

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Mendeleev Communications, 2004, Volume 14, Issue 4, Pages 155–157
DOI: https://doi.org/10.1070/MC2004v014n04ABEH001963 (Mi mendc3852)

This article is cited in 2 scientific papers (total in 2 papers)

The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy

O. V. Kotova^a, S. V. Eliseeva^b, E. V. Perevedentseva^c, T. F. Limonova^c, R. A. Baigeldieva^c, A. G. Vitukhnovsky^c, N. P. Kuzmina^b

^a Department of Materials Science, M.V. Lomonosov Moscow State University, Moscow, Russian Federation
^b Department of Chemistry, M.V. Lomonosov Moscow State University, Moscow, Russian Federation
^c P.N. Lebedev Physical Institute, Russian Academy of Sciences, Moscow, Russian Federation

Full-text PDF (218 kB) Citations (2)

DOI: https://doi.org/10.1070/MC2004v014n04ABEH001963

Abstract: The layer-by-layer roughness of organic light-emitting diode (OLED)-component functional thin films deposited from different solvents by a spin-coating method was studied using atomic force microscopy (AFM) facilities

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Document Type: Article

Language: English

Citation: O. V. Kotova, S. V. Eliseeva, E. V. Perevedentseva, T. F. Limonova, R. A. Baigeldieva, A. G. Vitukhnovsky, N. P. Kuzmina, “The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy”, Mendeleev Commun., 14:4 (2004), 155–157

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https://www.mathnet.ru/eng/mendc/v14/i4/p155

This publication is cited in the following 2 articles:

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