Optimal local reduction for space-invariant measuring systems

Space-invariant measuring systems with infinite field of vision (for instance, one or two-dimensional scanning measuring systems) are considered. Problem of construction of optimal reduction operator on the class of invariant mappings with the given carrier of aperture functions is discussed. It allows to realize real time experimental data processing with the aid of computer or special processor. Problem is oriented to potentially infinite set of measurements. Processing time is proportional to the size of data and can be lowered yet while using fast numerical algorithms or special processors.