Geometric simulation of nanomaterials structure for testing image segmentation techniques of scanning probe microscopy

The technique of the formation of simulation images that are used for testing image segmentation techniques of scanning probe microscopy has been developed. 3D geometrical model of nanomaterials comprise the combination of objects with a priori selected shapes and sizes with predetermined overlapping. The capability of base surface deformation in the model is realized in order to simulate coarse irregularities of the real nanomaterial. This approach provides visual bitmap image check of the model and gives the parameters for comparative analysis of the effectiveness of various segmentation algorithms: number of identifiable objects, area of the background and area of each fragment in the image scale.