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This article is cited in 1 scientific paper (total in 1 paper)
Brief Communications
On Test Sets Concerning Local Stuck-at Faults of Fixed Multiplicity at the Inputs of Circuits
G. Antyufeev, D. S. Romanova a Lomonosov Moscow State University
Keywords:
Boolean function, detection test, diagnostic test, Shannon function, stuck-at faults at the inputs of circuits.
Received: 15.11.2022 Revised: 18.03.2023
Published: 22.09.2023
Citation:
G. Antyufeev, D. S. Romanov, “On Test Sets Concerning Local Stuck-at Faults of Fixed Multiplicity at the Inputs of Circuits”, Mat. Zametki, 114:3 (2023), 458–463; Math. Notes, 114:3 (2023), 397–402
Linking options:
https://www.mathnet.ru/eng/mzm13812https://doi.org/10.4213/mzm13812 https://www.mathnet.ru/eng/mzm/v114/i3/p458
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