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Nanosystems: Physics, Chemistry, Mathematics, 2016, Volume 7, Issue 6, Pages 1002–1009
DOI: https://doi.org/10.17586/2220-8054-2016-7-6-1002-1009
(Mi nano304)
 

PHYSICS

Assessment for applicability of the “tangent technique” in X-ray small-angle scattering

A. V. Smirnov, V. Yu. Kalyakin, B. A. Fedorov

ITMO University, 49, Kronverkskiy, St. Petersburg, 197101, Russia
Abstract: A number of simple model systems are used to examine the applicability of the “tangent technique”, employed in the small-angle X-ray scattering for estimating the particle size distribution function, as well as to ascertain the relative contributions of the scattering intensity by differently sized particles to the total scattering intensity. The undertaken analysis has shown that, even in the most favorable case-an ensemble of two groups of different-size particles-the “tangent technique” cannot be used either to find the particle size proper, or to ascertain the relative contributions of individual groups to the total scattering intensity.
Keywords: small-angle X-ray scattering, size distribution of nanoparticles, Guinier plot.
Received: 27.07.2016
Revised: 04.08.2016
Bibliographic databases:
Document Type: Article
PACS: 61.05.cf
Language: English
Citation: A. V. Smirnov, V. Yu. Kalyakin, B. A. Fedorov, “Assessment for applicability of the “tangent technique” in X-ray small-angle scattering”, Nanosystems: Physics, Chemistry, Mathematics, 7:6 (2016), 1002–1009
Citation in format AMSBIB
\Bibitem{SmiKalFed16}
\by A.~V.~Smirnov, V.~Yu.~Kalyakin, B.~A.~Fedorov
\paper Assessment for applicability of the ``tangent technique'' in X-ray small-angle scattering
\jour Nanosystems: Physics, Chemistry, Mathematics
\yr 2016
\vol 7
\issue 6
\pages 1002--1009
\mathnet{http://mi.mathnet.ru/nano304}
\crossref{https://doi.org/10.17586/2220-8054-2016-7-6-1002-1009}
\isi{https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=Publons&SrcAuth=Publons_CEL&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=000393046700009}
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