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Optics and Spectroscopy, 2023, Volume 131, Issue 12, Pages 1708–1713 DOI: https://doi.org/10.61011/OS.2023.12.57407.5501-23
(Mi os1554)
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Optical materials
Two-wave method of laser-stimulated oxidation of the porous silicon layer
L. V. Grigor'evab, A. A. Semenovb, A. V. Mikhailovc a Saint Petersburg State University, 199034 St. Petersburg, Russia
b Saint Petersburg Electrotechnical University "LETI", 197022 St. Petersburg, Russia
c All-Russian Research Center "S. I. Vavilov State Optical Institute", 199101 St. Petersburg, Russia
DOI:
https://doi.org/10.61011/OS.2023.12.57407.5501-23
Abstract:
A new method of photon-stimulated surface treatment of a semiconductor is described the method of two- spectral laser-stimulated oxidation of a layer of porous silicon. The results of studying the optical properties of a layer of laser-oxidized nanoporous silicon in a spectral band are presented. The initial layer of nanoporous silicon was obtained by electrolytic etching of the surface of the single-crystal silicon KDB-10 (100) according to generally accepted method. The density of anode etching was 25.0 mA/cm$^2$. A laser-stimulated oxidation of a nanoporous silicon layer was carried out using two laser radiation lengths of unequal intensity at a fundamental wavelength of 1.064 $\mu$m using a DPSS YAG: Nd laser operating in a pulsed mode. The laser wavelengths for the photon-stimulated assay mode was 980 nm, 520 nm, and 405 nm.
Keywords:
photon-stimulated surface treatment, laser-stimulated oxidation, laser-oxidized nanoporous silicon, X-ray difraction, transmission spectra, structure integral optics.
Received: 20.08.2023 Revised: 20.08.2023 Accepted: 27.12.2023
Citation:
L. V. Grigor'ev, A. A. Semenov, A. V. Mikhailov, “Two-wave method of laser-stimulated oxidation of the porous silicon layer”, Optics and Spectroscopy, 131:12 (2023), 1708–1713
Linking options:
https://www.mathnet.ru/eng/os1554 https://www.mathnet.ru/eng/os/v131/i12/p1708
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| Statistics & downloads: |
| Abstract page: | 69 | | Full-text PDF : | 26 |
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