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Optics and Spectroscopy, 2022, Volume 130, Issue 7, Pages 1108–1113
DOI: https://doi.org/10.21883/OS.2022.07.52730.2193-21 (Mi os1794) 		 
Optics of low-dimensional structures, mesostructures, and metamaterials

IR transparency of thin bismuth films

E. Yu. Shamparov, A. L. Bugrimov, S. V. Rode, I. N. Jagrina

A. N. Kosygin RSU, 117997 Moscow, Russia
Full-text PDF (635 kB)
DOI: https://doi.org/10.21883/OS.2022.07.52730.2193-21
Abstract: The infrared transmission and reflection spectra of a series of samples of bismuth films of different thicknesses on identical single-crystal silicon substrates were measured. Transmission and reflection oscillations caused by interference on the film thickness are investigated. Properties of Si-plates are estimated. Refractive index and absorption index of bismuth are calculated.
Keywords: bismuth, film, IR, interference.
Received: 19.04.2021
Revised: 15.12.2021
Accepted: 28.01.2022
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: E. Yu. Shamparov, A. L. Bugrimov, S. V. Rode, I. N. Jagrina, “IR transparency of thin bismuth films”, Optics and Spectroscopy, 130:7 (2022), 1108–1113
Citation in format AMSBIB
\Bibitem{ShaBugRod22}
\by E.~Yu.~Shamparov, A.~L.~Bugrimov, S.~V.~Rode, I.~N.~Jagrina
\paper IR transparency of thin bismuth films
\jour Optics and Spectroscopy
\yr 2022
\vol 130
\issue 7
\pages 1108--1113
\mathnet{http://mi.mathnet.ru/os1794}
\crossref{https://doi.org/10.21883/OS.2022.07.52730.2193-21}
\elib{https://elibrary.ru/item.asp?id=49367663}
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