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Fizika i Tekhnika Poluprovodnikov, 2015, Volume 49, Issue 6, Pages 782–785 (Mi phts7314)  

This article is cited in 2 scientific papers (total in 2 papers)

Electronic properties of semiconductors

On the electronic properties of GaSb irradiated with reactor neutrons and its charge neutrality level

V. M. Boikoa, V. N. Brudnyib, V. S. Ermakova, N. G. Kolina, A. V. Korulina

a Karpov Institute of Physical Chemistry, Obninsk Branch
b Tomsk Polytechnic University
Full-text PDF (233 kB) Citations (2)
Abstract: The electronic properties and the limiting position of the Fermi level in $p$-GaSb crystals irradiated with full-spectrum reactor neutrons at up to a fluence of 8.6 $\times$ 10$^{18}$ cm$^{-2}$ are studied. It is shown that the irradiation of GaSb with reactor neutrons results in an increase in the concentration of free holes to $p_{\mathrm{lim}}$ = (5–6) $\times$ 10$^{18}$ cm$^{-3}$ and in pinning of the Fermi level at the limiting position $F_{\mathrm{lim}}$ close to $E_{\mathrm{V}}$ + 0.02 eV at 300 K. The effect of the annealing of radiation defects in the temperature range 100–550$^\circ$C is explored.
Received: 04.10.2014
Accepted: 20.10.2014
English version:
Semiconductors, 2015, Volume 49, Issue 6, Pages 763–766
DOI: https://doi.org/10.1134/S1063782615060068
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. M. Boiko, V. N. Brudnyi, V. S. Ermakov, N. G. Kolin, A. V. Korulin, “On the electronic properties of GaSb irradiated with reactor neutrons and its charge neutrality level”, Fizika i Tekhnika Poluprovodnikov, 49:6 (2015), 782–785; Semiconductors, 49:6 (2015), 763–766
Citation in format AMSBIB
\Bibitem{BoiBruErm15}
\by V.~M.~Boiko, V.~N.~Brudnyi, V.~S.~Ermakov, N.~G.~Kolin, A.~V.~Korulin
\paper On the electronic properties of GaSb irradiated with reactor neutrons and its charge neutrality level
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2015
\vol 49
\issue 6
\pages 782--785
\mathnet{http://mi.mathnet.ru/phts7314}
\elib{https://elibrary.ru/item.asp?id=24195197}
\transl
\jour Semiconductors
\yr 2015
\vol 49
\issue 6
\pages 763--766
\crossref{https://doi.org/10.1134/S1063782615060068}
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  • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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