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Fizika i Tekhnika Poluprovodnikov, 2014, Volume 48, Issue 6, Pages 768–773
(Mi phts7621)
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Surface, interfaces, thin films
Magnetoresistance of layered semiconductors upon the scattering of charge carriers at impurity ions in a parallel magnetic field
B. M. Askerova, S. R. Figarovaa, G. I. Guseinovb, V. R. Figarovc a Baku State University
b Azerbaidzhan University of Construction and Architecture
c Institute of Physics Azerbaijan Academy of Sciences
Abstract:
The magnetoresistance of a semiconductor superlattice in a magnetic field directed perpendicular to its axis for the case of the scattering of charge carriers at impurity ions is calculated. It is demonstrated that the sign of the transverse magnetoresistance strongly depends on the band filling factor, the value of the magnetic field, and the ratios between the screening radius, cyclotron orbital radius, and superlattice constant. In a parallel magnetic field, the transverse magnetoresistance of a two-dimensional electron gas is positive in a strong field and negative in a weak field. The transverse magnetoresistance of a quasi-two-dimensional electron gas changes its sign due to the presence of a negative effective mass region in the miniband.
Received: 21.10.2013 Accepted: 28.10.2013
Citation:
B. M. Askerov, S. R. Figarova, G. I. Guseinov, V. R. Figarov, “Magnetoresistance of layered semiconductors upon the scattering of charge carriers at impurity ions in a parallel magnetic field”, Fizika i Tekhnika Poluprovodnikov, 48:6 (2014), 768–773; Semiconductors, 48:6 (2014), 748–753
Linking options:
https://www.mathnet.ru/eng/phts7621 https://www.mathnet.ru/eng/phts/v48/i6/p768
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