On the electrically detected cyclotron resonance of holes in silicon nanostructures

The cyclotron resonance in semiconductor nanostructures is electrically detected for the first time without an external cavity, a source, and a detector of microwave radiation. An ultranarrow $p$-Si quantum well on an $n$-Si (100) surface confined by superconducting heavily boron-doped $\delta$-shaped barriers is used as the object of investigation and provides microwave generation within the framework of the nonstationary Josephson effect. The cyclotron resonance is detected upon the presence of a microcavity, which is incorporated into the quantum-well plane, by measuring the longitudinal magnetoresistance under conditions of stabilization of the source-drain current. The cyclotron-resonance spectra and their angular dependences measured in a low magnetic field identify small values of the effective mass of light and heavy holes in various 2D subbands due to the presence of edge channels with a high mobility of carriers.