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Fizika i Tekhnika Poluprovodnikov, 2013, Volume 47, Issue 9, Pages 1169–1174
(Mi phts8005)
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This article is cited in 1 scientific paper (total in 1 paper)
Surface, interfaces, thin films
Quantum self-consistent calculation of the differential capacitance of a semiconductor film
D. E. Tsurikov, A. M. Yafyasov St. Petersburg State University, Faculty of Physics
Abstract:
A fast scheme for calculating the surface differential capacitance of a semiconductor film with an ohmic contact on the rear side is proposed within the self-consistent solution of the Schrödinger and Poisson equations. The method is considered using germanium as an example. Comparison with the results of the phenomenological calculation revealed the specifics of size-quantization effects on the capacitance-voltage characteristic of the film.
Received: 07.06.2012 Accepted: 13.12.2012
Citation:
D. E. Tsurikov, A. M. Yafyasov, “Quantum self-consistent calculation of the differential capacitance of a semiconductor film”, Fizika i Tekhnika Poluprovodnikov, 47:9 (2013), 1169–1174; Semiconductors, 47:9 (2013), 1157–1163
Linking options:
https://www.mathnet.ru/eng/phts8005 https://www.mathnet.ru/eng/phts/v47/i9/p1169
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