|
|
Fizika i Tekhnika Poluprovodnikov, 2012, Volume 46, Issue 8, Pages 1088–1093
(Mi phts8311)
|
|
|
|
This article is cited in 7 scientific papers (total in 7 papers)
Semiconductor physics
Schottky contacts to high-resistivity epitaxial GaAs layers for detectors of particles and X- or $\gamma$-ray photons
G. I. Koltsova, S. I. Didenkoa, A. V. Chernykha, S. V. Chernykha, A. P. Chubenkob, Yu. N. Sveshnikovc a National University of Science and Technology «MISIS», Moscow
b P. N. Lebedev Physical Institute, Russian Academy of Sciences, Moscow
c JSC Elma-Malachit, Moscow, Zelenograd
Abstract:
The electrical characteristics of Ti and Pt Schottky contacts to epitaxial $n$-GaAs layers with the charge-carrier concentration $<$ 10$^{12}$ cm$^{-3}$ for detectors of particles and X- or $\gamma$-ray photons are studied. It is shown that it is preferable to use a diffusion-based theory of charge transport in calculations of the parameters of Schottky contacts to thick high-resistivity lightly compensated GaAs layers. The calculated barrier heights were 0.84 and 0.87 eV for the Ti and Pt contacts, respectively. The fabricated samples of the surface-barrier detectors featured a linear response in the studied range of energies from 6 to 140 keV for $\gamma$-ray photons and from 4 to 8 MeV for $\alpha$ particles; the efficiency of charge collection was close to 100% and the energy resolution was high at room temperature.
Received: 20.12.2011 Accepted: 30.12.2011
Citation:
G. I. Koltsov, S. I. Didenko, A. V. Chernykh, S. V. Chernykh, A. P. Chubenko, Yu. N. Sveshnikov, “Schottky contacts to high-resistivity epitaxial GaAs layers for detectors of particles and X- or $\gamma$-ray photons”, Fizika i Tekhnika Poluprovodnikov, 46:8 (2012), 1088–1093; Semiconductors, 46:8 (2012), 1066–1071
Linking options:
https://www.mathnet.ru/eng/phts8311 https://www.mathnet.ru/eng/phts/v46/i8/p1088
|
|