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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2019, Volume 45, Issue 22, Pages 28–31
DOI: https://doi.org/10.21883/PJTF.2019.22.48645.17893 (Mi pjtf5264) 		 
This article is cited in 2 scientific papers (total in 2 papers)

An unusual mechanism of misfit stress relaxation in thin nanofilms

E. M. Trukhanov, S. A. Teys

Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, Novosibirsk
Full-text PDF (546 kB) Citations (2)
DOI: https://doi.org/10.21883/PJTF.2019.22.48645.17893
Abstract: A new mechanism of misfit stress relaxation in nanofilms with variable density of surface phases is established. This phenomenon is ensured by ordered mass transfer of atoms from the strained atomic layer. The 7 $\times$ 7 $\to$ 5 $\times$ 5 phase transition in a Ge film on Si(111) substrate involves partial compensation of compressive stresses in the interface between volume (bulk) crystal and superstructure by means of tensile straining of loose layers of the surface phase.
Keywords: germanium, relaxation mechanism, superstructural transition, mass transfer.
Funding agency Grant number
Russian Foundation for Basic Research 16-29-03292
This work was supported by the Russian Foundation for Basic Research, project no. 16-29-03292.
Received: 24.05.2019
Revised: 15.07.2019
Accepted: 05.08.2019
English version:
Technical Physics Letters, 2019, Volume 45, Issue 11, Pages 1144–1147
DOI: https://doi.org/10.1134/S1063785019110282
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: E. M. Trukhanov, S. A. Teys, “An unusual mechanism of misfit stress relaxation in thin nanofilms”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:22 (2019), 28–31; Tech. Phys. Lett., 45:11 (2019), 1144–1147
Citation in format AMSBIB
\Bibitem{TruTey19}
\by E.~M.~Trukhanov, S.~A.~Teys
\paper An unusual mechanism of misfit stress relaxation in thin nanofilms
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2019
\vol 45
\issue 22
\pages 28--31
\mathnet{http://mi.mathnet.ru/pjtf5264}
\crossref{https://doi.org/10.21883/PJTF.2019.22.48645.17893}
\elib{https://elibrary.ru/item.asp?id=41848482}
\transl
\jour Tech. Phys. Lett.
\yr 2019
\vol 45
\issue 11
\pages 1144--1147
\crossref{https://doi.org/10.1134/S1063785019110282}
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    • This publication is cited in the following 2 articles:
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