|
|
Pisma v Zhurnal Tekhnicheskoi Fiziki, 2015, Volume 41, Issue 4, Pages 52–60
(Mi pjtf7636)
|
|
|
|
This article is cited in 10 scientific papers (total in 10 papers)
Spectral characteristics of nanometer-thick chromium films in terahertz frequency range
V. G. Andreeva, A. A. Angelutsa, V. A. Vdovinb, V. F. Lukichevc a Lomonosov Moscow State University
b Kotelnikov Institute of Radioengineering and Electronics of the Russian Academy of Sciences, Moscow
c Valiev Institute of Physics and Technology of Russian Academy of Sciences
Abstract:
The spectral characteristics (reflection, transmission, and absorption coefficients) of thin chromium films on silica substrates have been measured using a pulsed source of terahertz radiation. The spectra of optical coefficients were obtained in a frequency range of 0.25–1.1 THz. Dependences of the optical coefficients on the metal film thickness at 1 THz were constructed. The maximum absorption coefficient (43%) was observed at a film thickness of 10 nm.
Received: 10.09.2014
Citation:
V. G. Andreev, A. A. Angeluts, V. A. Vdovin, V. F. Lukichev, “Spectral characteristics of nanometer-thick chromium films in terahertz frequency range”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 41:4 (2015), 52–60; Tech. Phys. Lett., 41:2 (2015), 180–183
Linking options:
https://www.mathnet.ru/eng/pjtf7636 https://www.mathnet.ru/eng/pjtf/v41/i4/p52
|
|