Pisma v Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS


Pisma v Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find




Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register

Pisma v Zhurnal Tekhnicheskoi Fiziki, 2015, Volume 41, Issue 19, Pages 46–54 (Mi pjtf7850)  
This article is cited in 2 scientific papers (total in 2 papers)

An experimental study of the dependence of the diffraction efficiency of transmission holograms on the orientation and thickness of Bi$_{12}$SiO$_{20}$ crystal

A. V. Makarevicha, V. V. Shepelevicha, P. I. Ropotb, V. N. Naunykaa, S. M. Shandarovc

a Mozyr State Teacher's Training University named after I. P. Shamiakin
b B. I. Stepanov Institute of Physics, National Academy of Sciences of Belarus, Minsk
c Tomsk State University of Control Systems and Radioelectronics
Full-text PDF (1473 kB) Citations (2)
Abstract: Dependences of the diffraction efficiency of transmission holograms formed in a Bi$_{12}$SiO$_{20}$ photorefractive crystal on the orientation angle and thickness of the crystal have been experimentally studied. A theoretical interpretation of the obtained results is proposed.
Received: 28.04.2015
English version:
Technical Physics Letters, 2015, Volume 41, Issue 10, Pages 942–945
DOI: https://doi.org/10.1134/S1063785015100119
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. V. Makarevich, V. V. Shepelevich, P. I. Ropot, V. N. Naunyka, S. M. Shandarov, “An experimental study of the dependence of the diffraction efficiency of transmission holograms on the orientation and thickness of Bi$_{12}$SiO$_{20}$ crystal”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 41:19 (2015), 46–54; Tech. Phys. Lett., 41:10 (2015), 942–945
Citation in format AMSBIB
\Bibitem{MakSheRop15}
\by A.~V.~Makarevich, V.~V.~Shepelevich, P.~I.~Ropot, V.~N.~Naunyka, S.~M.~Shandarov
\paper An experimental study of the dependence of the diffraction efficiency of transmission holograms on the orientation and thickness of Bi$_{12}$SiO$_{20}$ crystal
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2015
\vol 41
\issue 19
\pages 46--54
\mathnet{http://mi.mathnet.ru/pjtf7850}
\elib{https://elibrary.ru/item.asp?id=24196538}
\transl
\jour Tech. Phys. Lett.
\yr 2015
\vol 41
\issue 10
\pages 942--945
\crossref{https://doi.org/10.1134/S1063785015100119}
Linking options:
  • https://www.mathnet.ru/eng/pjtf7850
  • https://www.mathnet.ru/eng/pjtf/v41/i19/p46
    • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Pisma v Zhurnal Tekhnicheskoi Fiziki Pisma v Zhurnal Tekhnicheskoi Fiziki
     
      Contact us:
    		  Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2025