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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2015, Volume 41, Issue 19, Pages 81–89
(Mi pjtf7854)
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This article is cited in 4 scientific papers (total in 4 papers)
The effect of irradiation with H$^+$ and Ne$^+$ ions on resistive switching in metal–insulator–metal memristive structures based on SiO$_x$
A. I. Belova, A. N. Mikhaylova, D. S. Koroleva, V. A. Sergeeva, E. V. Okulicha, I. N. Antonova, A. P. Kasatkina, E. G. Gryaznovab, A. P. Yatmanovb, O. N. Gorshkova, D. I. Tetelbauma a Lobachevsky State University of Nizhny Novgorod
b Sedakov Research Institute for Measurement Systems, Nizhny Novgorod, 603950, Russia
Abstract:
The effect of irradiation with H$^+$ and Ne$^+$ ions with an energy of 150 keV on memristive Au/SiO$_x$/TiN/Ti structures, which were obtained by magnetron sputtering and exhibited a reproducible resistive switching effect, is studied. It is demonstrated that the low and high resistance states remain unchanged up to a dose of 1 $\cdot$ 10$^{16}$ cm$^{-2}$ in the case of irradiation with H$^+$ ions and a dose of $\sim$ 3 $\cdot$ 10$^{15}$ cm$^{-2}$ under irradiation with Ne$^+$ ions. The obtained results demonstrate the high tolerance of parameters of the studied memristive structures to both ionizing radiation and displacement damage.
Received: 05.05.2015
Citation:
A. I. Belov, A. N. Mikhaylov, D. S. Korolev, V. A. Sergeev, E. V. Okulich, I. N. Antonov, A. P. Kasatkin, E. G. Gryaznov, A. P. Yatmanov, O. N. Gorshkov, D. I. Tetelbaum, “The effect of irradiation with H$^+$ and Ne$^+$ ions on resistive switching in metal–insulator–metal memristive structures based on SiO$_x$”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 41:19 (2015), 81–89; Tech. Phys. Lett., 41:10 (2015), 957–960
Linking options:
https://www.mathnet.ru/eng/pjtf7854 https://www.mathnet.ru/eng/pjtf/v41/i19/p81
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