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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2014, Volume 40, Issue 5, Pages 8–14
(Mi pjtf8089)
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This article is cited in 13 scientific papers (total in 13 papers)
Features of photoacoustic transformation in microporous nanocrystalline silicon
A. I. Titarenko, D. A. Andrusenko, A. G. Kuz'mich, I. V. Gavril'chenko, V. A. Skryshevsky, N. V. Isaev, R. M. Burbelo National Taras Shevchenko University of Kyiv
Abstract:
Results of a study of the photoacoustic transformation in microporous nanocrystalline silicon are described. The amplitude-frequency and phase-frequency characteristics of the photoacoustic signal from microporous silicon samples on a monocrystalline substrate exposed to illumination at various wavelengths are experimentally determined. Informative response was measured by the gas-microphone and piezoelectric detection methods. In terms of the proposed mathematical model, it is shown that the difference in the parameters of the photoacoustic signal for different wavelengths of exciting radiation is attributed to a shift of the fundamental absorption edge in nanocrystalline silicon. It is pointed out that the piezoelectric detection method is more sensitive to changes in the thermophysical and optical parameters of the porous layer.
Received: 27.09.2013
Citation:
A. I. Titarenko, D. A. Andrusenko, A. G. Kuz'mich, I. V. Gavril'chenko, V. A. Skryshevsky, N. V. Isaev, R. M. Burbelo, “Features of photoacoustic transformation in microporous nanocrystalline silicon”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:5 (2014), 8–14; Tech. Phys. Lett., 40:3 (2014), 188–191
Linking options:
https://www.mathnet.ru/eng/pjtf8089 https://www.mathnet.ru/eng/pjtf/v40/i5/p8
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