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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2014, Volume 40, Issue 16, Pages 58–64
(Mi pjtf8235)
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This article is cited in 6 scientific papers (total in 6 papers)
Effect of low-frequency noise on the threshold sensitivity of middle-IR photodetectors in a broad frequency range
S. E. Aleksandrovab, G. A. Gavrilovab, G. Yu. Sotnikovaab a Ioffe Institute, St. Petersburg
b Peter the Great St. Petersburg Polytechnic University
Abstract:
Low-frequency noise of a photodiode-based photodetector (PD) implementing a transimpedance amplifier scheme has been analyzed. It is found that the low-frequency (drift) noise component in the input chains of modern operational amplifiers makes a decisive contribution to resultant noises of PDs based on A$^3$B$^5$ photodiodes at frequencies up to several hundred kilohertz. An illustrative “vector” method of description of the noise characteristics of PD elements is proposed for selecting the optimum type of operational amplifier so as to achieve the final sensitivity and accuracy characteristics at a given response speed.
Received: 09.04.2014
Citation:
S. E. Aleksandrov, G. A. Gavrilov, G. Yu. Sotnikova, “Effect of low-frequency noise on the threshold sensitivity of middle-IR photodetectors in a broad frequency range”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 40:16 (2014), 58–64; Tech. Phys. Lett., 40:8 (2014), 704–707
Linking options:
https://www.mathnet.ru/eng/pjtf8235 https://www.mathnet.ru/eng/pjtf/v40/i16/p58
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