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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2013, Volume 39, Issue 2, Pages 1–6
(Mi pjtf8382)
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This article is cited in 8 scientific papers (total in 8 papers)
Specific features of the photodielectric effect in amorphous $\alpha$-As$_2$Se$_3$ layers
N. I. Anisimova, V. A. Bordovskii, G. I. Grabko, R. A. Castro Herzen State Pedagogical University of Russia, St. Petersburg
Abstract:
The photodielectric effect (PDE) in amorphous arsenic triselenide (As$_2$Se$_3$) layers has been studied in a weakly varying electric field. As the field frequency decreases in the infra-low-frequency range, the experimentally measured function of relative conductivity coincides with the theoretically predicted behavior. It is established that the frequency dependence of the recombination coefficient exhibits a minimum.
Received: 08.06.2012
Citation:
N. I. Anisimova, V. A. Bordovskii, G. I. Grabko, R. A. Castro, “Specific features of the photodielectric effect in amorphous $\alpha$-As$_2$Se$_3$ layers”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 39:2 (2013), 1–6; Tech. Phys. Lett., 39:1 (2013), 98–100
Linking options:
https://www.mathnet.ru/eng/pjtf8382 https://www.mathnet.ru/eng/pjtf/v39/i2/p1
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