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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2013, Volume 39, Issue 7, Pages 19–25 (Mi pjtf8461)  
This article is cited in 3 scientific papers (total in 3 papers)

Electron diffraction measurement of the binding rigidity of free-standing graphene

D. A. Kirilenkoab

a Ioffe Institute, St. Petersburg
b University of Antwerp, BE-2020 Antwerpen, Belgium
Full-text PDF (471 kB) Citations (3)
Abstract: A method for measuring the binding rigidity of free-standing graphene from the dependence of the short-wavelength spectral range of transverse structural fluctuations of a crystal is proposed. The fluctuation spectrum is measured according to the variation in electron-diffraction patterns derived in a transmission electron microscope while tilting the sample.
Received: 11.11.2012
English version:
Technical Physics Letters, 2013, Volume 39, Issue 4, Pages 325–328
DOI: https://doi.org/10.1134/S1063785013040081
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: D. A. Kirilenko, “Electron diffraction measurement of the binding rigidity of free-standing graphene”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 39:7 (2013), 19–25; Tech. Phys. Lett., 39:4 (2013), 325–328
Citation in format AMSBIB
\Bibitem{Kir13}
\by D.~A.~Kirilenko
\paper Electron diffraction measurement of the binding rigidity of free-standing graphene
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2013
\vol 39
\issue 7
\pages 19--25
\mathnet{http://mi.mathnet.ru/pjtf8461}
\elib{https://elibrary.ru/item.asp?id=20328145}
\transl
\jour Tech. Phys. Lett.
\yr 2013
\vol 39
\issue 4
\pages 325--328
\crossref{https://doi.org/10.1134/S1063785013040081}
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    • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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