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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2013, Volume 39, Issue 24, Pages 30–37
(Mi pjtf8667)
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This article is cited in 1 scientific paper (total in 1 paper)
Features of the magnetic properties of Co/Si/Co thin-film systems
E. E. Shalyginaab, A. M. Kharlamovaab, A. A. Rozhnovskayaab, G. V. Kurlyandskayaab, A. V. Svalovab a Lomonosov Moscow State University
b Ural Federal University, Yekaterinburg, 620002, Russia
Abstract:
The magnetic properties of Co/Si/Co thin-film structures grown by magnetron sputtering have been studied using magnetooptical techniques. It is established that the saturation field $(H_S)$ of trilayers exhibits oscillations as a function of the thickness of the semiconductor (silicon) interlayer. This behavior is explained by structural features of the Co/Si/Co system and the presence of antiferromagnetic exchange coupling between magnetic layers via the silicon interlayer.
Received: 27.06.2013
Citation:
E. E. Shalygina, A. M. Kharlamova, A. A. Rozhnovskaya, G. V. Kurlyandskaya, A. V. Svalov, “Features of the magnetic properties of Co/Si/Co thin-film systems”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 39:24 (2013), 30–37; Tech. Phys. Lett., 39:12 (2013), 1089–1092
Linking options:
https://www.mathnet.ru/eng/pjtf8667 https://www.mathnet.ru/eng/pjtf/v39/i24/p30
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