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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2012, Volume 38, Issue 6, Pages 68–76
(Mi pjtf8805)
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This article is cited in 3 scientific papers (total in 3 papers)
Studying structure of thin copper phthalocyanine films by reflectance anisotropy spectroscopy
V. L. Berkovits, A. B. Gordeeva, V. A. Kosobukin, E. I. Terukov Ioffe Institute, St. Petersburg
Abstract:
The structure of thin molecular films of copper phthalocyanine (CuPc) on crystalline GaAs(001) and glass substrates has been studied by the method of reflectance anisotropy spectroscopy. It is shown that, using this method, it is possible to determine the orientational anisotropy in CuPc layers. It is established that the GaAs crystal surface produces orienting action on the molecular structure of CuPc films, while a glass substrate does not exhibit this effect. A model of the anisotropic reflection of light is considered that provides satisfactory description of the orientation-related features in the spectra of thin CuPc films as dependent on their thicknesses.
Received: 27.11.2011
Citation:
V. L. Berkovits, A. B. Gordeeva, V. A. Kosobukin, E. I. Terukov, “Studying structure of thin copper phthalocyanine films by reflectance anisotropy spectroscopy”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:6 (2012), 68–76; Tech. Phys. Lett., 38:3 (2012), 286–289
Linking options:
https://www.mathnet.ru/eng/pjtf8805 https://www.mathnet.ru/eng/pjtf/v38/i6/p68
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