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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2012, Volume 38, Issue 6, Pages 77–82
(Mi pjtf8806)
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This article is cited in 3 scientific papers (total in 3 papers)
Composition and submicron structure of chemically deposited Cu$_2$Se–In$_2$Se$_3$ films
V. F. Markovabc, S. S. Tuleninabc, L. N. Maskaevaabc, M. V. Kuznetsovabc, N. M. Barbinabc a Ural Federal University named after the First President of Russia B. N. Yeltsin, Ekaterinburg
b Institute of Solid State Chemistry, Urals Branch of the Russian Academy of Sciences, Ekaterinburg
c Ural Institute of the State Fire Service
Abstract:
Films of substitutional solid solutions of the Cu$_2$Se–In$_2$Se$_3$ system containing up to 7.5 at.% In have been obtained by chemical deposition from aqueous media. The composition, structure, and morphology of the films have been studied. Data of X-ray diffraction and X-ray photoelectron spectroscopy showed that copper in the solid solution occurs in a single-valence state (Cu$^+$). The deposited layers possess a globular morphology and are nanostructured.
Received: 07.11.2011
Citation:
V. F. Markov, S. S. Tulenin, L. N. Maskaeva, M. V. Kuznetsov, N. M. Barbin, “Composition and submicron structure of chemically deposited Cu$_2$Se–In$_2$Se$_3$ films”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:6 (2012), 77–82; Tech. Phys. Lett., 38:3 (2012), 290–293
Linking options:
https://www.mathnet.ru/eng/pjtf8806 https://www.mathnet.ru/eng/pjtf/v38/i6/p77
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