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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2012, Volume 38, Issue 16, Pages 87–94 (Mi pjtf8937)  
This article is cited in 4 scientific papers (total in 4 papers)

Thin magnetite films on an oxidized silicon surface: Raman spectroscopy study

V. A. Vikulovab, V. V. Balashevab, T. A. Pisarenkoab, A. A. Dmitrievab, V. V. Korobtsovab

a Institute for Automation and Control Processes, Far Eastern Branch of the Russian Academy of Sciences, Vladivostok
b School of Natural Sciences, Far Eastern Federal University, Vladivostok
Full-text PDF (1564 kB) Citations (4)
Abstract: Polycrystalline films of magnetite (Fe$_3$O$_4$) formed by the reactive sputtering of iron in oxygen on Si(001) substrates covered by thin (1.4 nm) or thick (1200 nm) SiO$_2$ layers have been studied by Raman spectroscopy. It is established that (i) the $\alpha$-Fe$_2$O$_3$ phase is formed due to the laser-induced heating in magnetite films synthesized on thick SiO$_2$ layers and (ii) the formation of $\alpha$-Fe$_2$O$_3$ phase depends on the thickness of the buffer SiO$_2$ layer.
Received: 14.03.2012
English version:
Technical Physics Letters, 2012, Volume 38, Issue 8, Pages 772–775
DOI: https://doi.org/10.1134/S106378501208024X
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: V. A. Vikulov, V. V. Balashev, T. A. Pisarenko, A. A. Dmitriev, V. V. Korobtsov, “Thin magnetite films on an oxidized silicon surface: Raman spectroscopy study”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:16 (2012), 87–94; Tech. Phys. Lett., 38:8 (2012), 772–775
Citation in format AMSBIB
\Bibitem{VikBalPis12}
\by V.~A.~Vikulov, V.~V.~Balashev, T.~A.~Pisarenko, A.~A.~Dmitriev, V.~V.~Korobtsov
\paper Thin magnetite films on an oxidized silicon surface: Raman spectroscopy study
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2012
\vol 38
\issue 16
\pages 87--94
\mathnet{http://mi.mathnet.ru/pjtf8937}
\elib{https://elibrary.ru/item.asp?id=20327962}
\transl
\jour Tech. Phys. Lett.
\yr 2012
\vol 38
\issue 8
\pages 772--775
\crossref{https://doi.org/10.1134/S106378501208024X}
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    • This publication is cited in the following 4 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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