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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2012, Volume 38, Issue 17, Pages 24–30
(Mi pjtf8941)
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Low-temperature properties of porous silicon-indium nanocomposite
L. M. Sorokin, A. V. Fokin, A. E. Kalmykov, A. V. Chernyaev Ioffe Institute, St. Petersburg
Abstract:
A new nanocomposite material with stable properties has been obtained representing a metal (indium) incorporated into a semiconducting porous silicon (por-Si) matrix. Electrical properties of the por-Si-In nanocomposite have been studied for the first time. At low temperatures ($T$ = 1.4–4.2 K), the por-Si-In samples exhibit a positive magnetoresistance [$\Delta R/R(H=0)\approx$ 600%], which is related to breakage of the superconducting state of In particles in the por-Si matrix.
Received: 20.02.2012
Citation:
L. M. Sorokin, A. V. Fokin, A. E. Kalmykov, A. V. Chernyaev, “Low-temperature properties of porous silicon-indium nanocomposite”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:17 (2012), 24–30; Tech. Phys. Lett., 38:9 (2012), 789–792
Linking options:
https://www.mathnet.ru/eng/pjtf8941 https://www.mathnet.ru/eng/pjtf/v38/i17/p24
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