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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2012, Volume 38, Issue 21, Pages 70–76
(Mi pjtf8999)
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This article is cited in 2 scientific papers (total in 2 papers)
A new approach to understanding the mechanisms of diffraction imaging of dislocations in X-ray topography
E. V. Suvorov, I. A. Smirnova Osipyan Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region
Abstract:
Regularities in the formation of diffraction imaging of dislocations are studied by numerical modeling and experimental section X-ray topography. The study of X-ray scattering by irregularities of the crystal lattice is of interest for several reasons. First, the contrast of defects is connected with the fundamental problem of development of a dynamic theory of X-ray scattering in real crystals. Second, knowledge of the special features of diffraction makes possible a qualitative and, in some cases, quantitative analysis of the X-ray diffraction contrast of defects in a crystal lattice (measurements of the deformation, determination of the sign and parameters of the Burgers vector, etc.).
Received: 09.07.2012
Citation:
E. V. Suvorov, I. A. Smirnova, “A new approach to understanding the mechanisms of diffraction imaging of dislocations in X-ray topography”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:21 (2012), 70–76; Tech. Phys. Lett., 38:11 (2012), 991–994
Linking options:
https://www.mathnet.ru/eng/pjtf8999 https://www.mathnet.ru/eng/pjtf/v38/i21/p70
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