Pisma v Zhurnal Tekhnicheskoi Fiziki
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive
Guidelines for authors

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Pisma v Zhurnal Tekhnicheskoi Fiziki:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Pisma v Zhurnal Tekhnicheskoi Fiziki, 2012, Volume 38, Issue 21, Pages 70–76 (Mi pjtf8999)  

This article is cited in 2 scientific papers (total in 2 papers)

A new approach to understanding the mechanisms of diffraction imaging of dislocations in X-ray topography

E. V. Suvorov, I. A. Smirnova

Osipyan Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region
Full-text PDF (404 kB) Citations (2)
Abstract: Regularities in the formation of diffraction imaging of dislocations are studied by numerical modeling and experimental section X-ray topography. The study of X-ray scattering by irregularities of the crystal lattice is of interest for several reasons. First, the contrast of defects is connected with the fundamental problem of development of a dynamic theory of X-ray scattering in real crystals. Second, knowledge of the special features of diffraction makes possible a qualitative and, in some cases, quantitative analysis of the X-ray diffraction contrast of defects in a crystal lattice (measurements of the deformation, determination of the sign and parameters of the Burgers vector, etc.).
Received: 09.07.2012
English version:
Technical Physics Letters, 2012, Volume 38, Issue 11, Pages 991–994
DOI: https://doi.org/10.1134/S1063785012110132
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: E. V. Suvorov, I. A. Smirnova, “A new approach to understanding the mechanisms of diffraction imaging of dislocations in X-ray topography”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 38:21 (2012), 70–76; Tech. Phys. Lett., 38:11 (2012), 991–994
Citation in format AMSBIB
\Bibitem{SuvSmi12}
\by E.~V.~Suvorov, I.~A.~Smirnova
\paper A new approach to understanding the mechanisms of diffraction imaging of dislocations in X-ray topography
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2012
\vol 38
\issue 21
\pages 70--76
\mathnet{http://mi.mathnet.ru/pjtf8999}
\elib{https://elibrary.ru/item.asp?id=20328025}
\transl
\jour Tech. Phys. Lett.
\yr 2012
\vol 38
\issue 11
\pages 991--994
\crossref{https://doi.org/10.1134/S1063785012110132}
Linking options:
  • https://www.mathnet.ru/eng/pjtf8999
  • https://www.mathnet.ru/eng/pjtf/v38/i21/p70
  • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Pisma v Zhurnal Tekhnicheskoi Fiziki Pisma v Zhurnal Tekhnicheskoi Fiziki
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2025