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Kvantovaya Elektronika, 1993, Volume 20, Number 9, Pages 925–932 (Mi qe3174)  

Laser applications and other topics in quantum electronics

Effect of photoabsorptive convection on the rate of cw-CO2-laser induced chemical vapor deposition of amorphous hydrogenated silicon

A. A. Deryugina, G. V. Mishakovb

a Troitsk Institute for Innovation and Fusion Research
b Research Centre for Technological Lasers Academy of Sciences of the Russian Federation, Moscow
Abstract: The deposition rate has been studied as a function of geometric parameters during chemical deposition of silicon from a mixture of monosilane and argon induced by a cw CO2 laser. The geometric parameters were the beam diameter and the distance between the beam axis and the substrate. Direct thermocouple measurements of the gas temperature were carried out near the laser beam in order to identify the reasons for the observed behavior. The results of these measurements were compared with the results of a numerical simulation. The calculated behavior of the gas temperature as a function of the distance from the beam axis to the substrate agrees well with the experimental data, while the calculated behavior of the gas temperature as a function of the beam diameter does not. It is concluded from an analysis of the results and of data in the literature that the reason for the decrease in the deposition rate with decreasing beam diameter (at a fixed beam power) is an intensification of photoabsorptive convection. Convective cooling of the gas must be taken into account in order to construct an adequate theoretical model for the process.
Received: 29.01.1993
English version:
Quantum Electronics, 1993, Volume 23, Issue 9, Pages 805–812
DOI: https://doi.org/10.1070/QE1993v023n09ABEH003174
Bibliographic databases:
Document Type: Article
UDC: 621.373.826
PACS: 81.15.Fg, 81.15.Gh, 64.75.+g
Language: Russian


Citation: A. A. Deryugin, G. V. Mishakov, “Effect of photoabsorptive convection on the rate of cw-CO2-laser induced chemical vapor deposition of amorphous hydrogenated silicon”, Kvantovaya Elektronika, 20:9 (1993), 925–932 [Quantum Electron., 23:9 (1993), 805–812]
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