Proceedings of the Institute for System Programming of the RAS
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Proceedings of ISP RAS:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Proceedings of the Institute for System Programming of the RAS, 2016, Volume 28, Issue 4, Pages 77–98
DOI: https://doi.org/10.15514/ISPRAS-2016-28(4)-5
(Mi tisp54)
 

This article is cited in 4 scientific papers (total in 4 papers)

Language for describing templates for test program generation for microprocessors

A. D. Tatarnikov

Institute for System Programming of the Russian Academy of Sciences
Full-text PDF (450 kB) Citations (4)
References:
Abstract: Test program generation and simulation is the most widely used approach to functional verification of microprocessors. High complexity of modern hardware designs creates a demand for automated tools that are able to generate test programs covering non-trivial situations in microprocessor functioning. The majority of such tools use test program templates that describe scenarios to be covered in an abstract way. This provides verification engineers with a flexible way to describe a wide range of test generation tasks with minimum effort. Test program templates are developed in special domain-specific languages. These languages must fulfill the following requirements: (1) be simple enough to be used by verification engineers with no sufficient programming skills; (2) be applicable to various microprocessor architectures and (3) be easy to extend with facilities for describing new types of test generation tasks. The present work discusses the test program template description language used in the reconfigurable and extensible test program generation framework MicroTESK being developed at ISP RAS. It is a flexible Ruby-based domain-specific language that allows describing a wide range of test generation tasks in terms of hardware abstractions. The tool and the language have been applied in industrial projects dedicated to verification of MIPS and ARM microprocessors.
Keywords: microprocessors, functional verification, test program generation, test templates, domain-specific languages.
Bibliographic databases:
Document Type: Article
Language: English
Citation: A. D. Tatarnikov, “Language for describing templates for test program generation for microprocessors”, Proceedings of ISP RAS, 28:4 (2016), 77–98
Citation in format AMSBIB
\Bibitem{Tat16}
\by A.~D.~Tatarnikov
\paper Language for describing templates for test program generation for microprocessors
\jour Proceedings of ISP RAS
\yr 2016
\vol 28
\issue 4
\pages 77--98
\mathnet{http://mi.mathnet.ru/tisp54}
\crossref{https://doi.org/10.15514/ISPRAS-2016-28(4)-5}
\elib{https://elibrary.ru/item.asp?id=27174140}
Linking options:
  • https://www.mathnet.ru/eng/tisp54
  • https://www.mathnet.ru/eng/tisp/v28/i4/p77
  • This publication is cited in the following 4 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Proceedings of the Institute for System Programming of the RAS
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2025