Teplofizika vysokikh temperatur
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Teplofizika vysokikh temperatur, 2012, Volume 50, Issue 2, Pages 316–317 (Mi tvt316)  

This article is cited in 7 scientific papers (total in 7 papers)

Short Communications

Investigation of formation of an adsorption film by high-frequency dielectric spectrometry

R. R. Zinnatullin, Yu. I. Fatkhullina, I. M. Kamaltdinov

Center of Micro- and Nanoscale Dynamics of Disperse Systems, Bashkir State University, ul. Zaki Validi 32, Ufa, 450074, Russia
Full-text PDF (204 kB) Citations (7)
References:
Received: 06.04.2011
English version:
High Temperature, 2012, Volume 50, Issue 2, Pages 298–299
DOI: https://doi.org/10.1134/S0018151X1202023X
Bibliographic databases:
Document Type: Article
UDC: 532.74:544.723.212
Language: Russian
Citation: R. R. Zinnatullin, Yu. I. Fatkhullina, I. M. Kamaltdinov, “Investigation of formation of an adsorption film by high-frequency dielectric spectrometry”, TVT, 50:2 (2012), 316–317; High Temperature, 50:2 (2012), 298–299
Citation in format AMSBIB
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\paper Investigation of formation of an adsorption film by high-frequency dielectric spectrometry
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\vol 50
\issue 2
\pages 316--317
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\transl
\jour High Temperature
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\pages 298--299
\crossref{https://doi.org/10.1134/S0018151X1202023X}
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  • https://www.mathnet.ru/eng/tvt/v50/i2/p316
  • This publication is cited in the following 7 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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