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Numerical methods and programming, 2001, Volume 2, Issue 1, Pages 92–111 (Mi vmp769)  

This article is cited in 1 scientific paper (total in 1 paper)

Numerical simulation for the problem of dynamics of oxide film growth in semiconductor substrates on the basis of geometrical approach and the Deal-Grove method

A. L. Alexandrova, G. A. Tarnavskiia, S. I. Shpaka, A. I. Gulidova, M. S. Obrechtb

a Khristianovich Institute of Theoretical and Applied Mechanics, Siberian Branch of the Russian Academy of Sciences, Novosibirsk
b University of Waterloo
Abstract: An approximate simulation for the dynamics of oxide film growth in semiconductor substrates is developed. A generalization of the 1D Deal-Grove method to 2D problems is proposed on the basis of geometrical approach. Some numerical results are given for the following cases: 1) the growth of a subregion for SiO2 under oxidation in various mediums (O2 or H2O) and 2) the dynamics of oxide/material and oxide/oxidant boundaries in a wide range of constitutive parameters and nitride masks covering a part of the silicon surface.
Keywords: film growth, material oxidation, nitride masks, numerical simulation, semiconductors.
UDC: 519.2:541.1
Language: Russian
Citation: A. L. Alexandrov, G. A. Tarnavskii, S. I. Shpak, A. I. Gulidov, M. S. Obrecht, “Numerical simulation for the problem of dynamics of oxide film growth in semiconductor substrates on the basis of geometrical approach and the Deal-Grove method”, Num. Meth. Prog., 2:1 (2001), 92–111
Citation in format AMSBIB
\Bibitem{AleTarShp01}
\by A.~L.~Alexandrov, G.~A.~Tarnavskii, S.~I.~Shpak, A.~I.~Gulidov, M.~S.~Obrecht
\paper Numerical simulation for the problem of dynamics of oxide film growth in
semiconductor substrates on the basis of geometrical approach and the
Deal-Grove method
\jour Num. Meth. Prog.
\yr 2001
\vol 2
\issue 1
\pages 92--111
\mathnet{http://mi.mathnet.ru/vmp769}
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  • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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