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Numerical methods and programming, 2001, Volume 2, Issue 1, Pages 92–111
(Mi vmp769)
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This article is cited in 1 scientific paper (total in 1 paper)
Numerical simulation for the problem of dynamics of oxide film growth in
semiconductor substrates on the basis of geometrical approach and the
Deal-Grove method
A. L. Alexandrova, G. A. Tarnavskiia, S. I. Shpaka, A. I. Gulidova, M. S. Obrechtb a Khristianovich Institute of Theoretical and Applied Mechanics, Siberian Branch of the Russian Academy of Sciences, Novosibirsk
b University of Waterloo
Abstract:
An approximate simulation for the dynamics of oxide film growth in
semiconductor substrates is developed. A generalization of the 1D Deal-Grove
method to 2D problems is proposed on the basis of geometrical approach. Some
numerical results are given for the following cases: 1) the growth of a
subregion for SiO2 under oxidation in various mediums (O2 or H2O) and 2) the
dynamics of oxide/material and oxide/oxidant boundaries in a wide range of
constitutive parameters and nitride masks covering a part of the silicon
surface.
Keywords:
film growth, material oxidation, nitride masks, numerical simulation, semiconductors.
Citation:
A. L. Alexandrov, G. A. Tarnavskii, S. I. Shpak, A. I. Gulidov, M. S. Obrecht, “Numerical simulation for the problem of dynamics of oxide film growth in
semiconductor substrates on the basis of geometrical approach and the
Deal-Grove method”, Num. Meth. Prog., 2:1 (2001), 92–111
Linking options:
https://www.mathnet.ru/eng/vmp769 https://www.mathnet.ru/eng/vmp/v2/i1/p92
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