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Computational nanotechnology, 2021, Volume 8, Issue 3, Pages 69–75
DOI: https://doi.org/10.33693/2313-223X-2021-8-3-69-75
(Mi cn349)
 

INTELLIGENT TECHNICAL SYSTEMS IN MANUFACTURING AND INDUSTRIAL PRACTICE

Theoretical and methodological study of the metrological support system

E. B. Isgandarzada, G. S. Valiyev, Sh. V. Ahmadli, A. Ya. Zulfugarova, U. R. Islamova

Azerbaijan Technical University
Abstract: The system of metrological support is the basis of product quality management at a machine-building enterprise. The most important element of metrological support is the real quality parameters. It was studied that the administrative management system does not create conditions for the implementation of objective technical management and, as a result, for the optimization of the management structure, reduction of production costs and quality assurance. This problem can be solved only through the development of appropriate mathematical models of metrological support systems and production process control. However, in order to build mathematical models of metrological support and production process control systems, it is necessary to establish functional and structural diagrams of the technological process and form a process for obtaining graphic models using product reliability parameters. A model is a simplified system that reflects individual elements and more important aspects of the process under study. The same process can be described by different models, and one model can describe different processes. One of the most important and difficult issues in modeling is the definition of key indicators of the system, which should more fully reflect the quality of the product. These parameters include failure, durability, time spent on product development and commissioning, etc. Thus, the problem of modeling a metrological assurance system can be formulated as follows: it is necessary to find a system that meets the aggregate requirements of the initial data, and in this case the quality indicators should have the best values in accordance with a previously selected higher criterion.
Keywords: product quality, metrological assurance, system model, modeling, continuity, Boolean models, Markov models.
Received: 03.08.2021
Document Type: Article
Language: Russian
Citation: E. B. Isgandarzada, G. S. Valiyev, Sh. V. Ahmadli, A. Ya. Zulfugarova, U. R. Islamova, “Theoretical and methodological study of the metrological support system”, Comp. nanotechnol., 8:3 (2021), 69–75
Citation in format AMSBIB
\Bibitem{IsgValAhm21}
\by E.~B.~Isgandarzada, G.~S.~Valiyev, Sh.~V.~Ahmadli, A.~Ya.~Zulfugarova, U.~R.~Islamova
\paper Theoretical and methodological study of the metrological support system
\jour Comp. nanotechnol.
\yr 2021
\vol 8
\issue 3
\pages 69--75
\mathnet{http://mi.mathnet.ru/cn349}
\crossref{https://doi.org/10.33693/2313-223X-2021-8-3-69-75}
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