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CRYSTALLOGRAPHY
On the X-ray reflectometry technique of the structure determination of Langmuir–Blodgett films with a small amount of layers
O. V. Konovalov, L. A. Feigin Institute of Cristallography of the USSR Academy of Sciences, Moscow
Citation:
O. V. Konovalov, L. A. Feigin, “On the X-ray reflectometry technique of the structure determination of Langmuir–Blodgett films with a small amount of layers”, Dokl. Akad. Nauk SSSR, 320:2 (1991), 334–338
Linking options:
https://www.mathnet.ru/eng/dan49229 https://www.mathnet.ru/eng/dan/v320/i2/p334
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Abstract page: | 105 | Full-text PDF : | 29 | References: | 5 |
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