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Doklady Akademii Nauk SSSR, 1991, Volume 320, Number 2, Pages 334–338 (Mi dan49229)  

CRYSTALLOGRAPHY

On the X-ray reflectometry technique of the structure determination of Langmuir–Blodgett films with a small amount of layers

O. V. Konovalov, L. A. Feigin

Institute of Cristallography of the USSR Academy of Sciences, Moscow
Presented: B. K. Vaĭnshteĭn
Received: 08.07.1991
Document Type: Article
UDC: 548.737+539.233
Language: Russian
Citation: O. V. Konovalov, L. A. Feigin, “On the X-ray reflectometry technique of the structure determination of Langmuir–Blodgett films with a small amount of layers”, Dokl. Akad. Nauk SSSR, 320:2 (1991), 334–338
Citation in format AMSBIB
\Bibitem{KonFei91}
\by O.~V.~Konovalov, L.~A.~Feigin
\paper On the X-ray reflectometry technique of the structure determination of Langmuir--Blodgett films with a small amount of layers
\jour Dokl. Akad. Nauk SSSR
\yr 1991
\vol 320
\issue 2
\pages 334--338
\mathnet{http://mi.mathnet.ru/dan49229}
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  • https://www.mathnet.ru/eng/dan/v320/i2/p334
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