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Differentsial'nye Uravneniya, 2000, Volume 36, Number 9, Pages 1238–1247 (Mi de10220)  
This article is cited in 3 scientific papers (total in 3 papers)

Numerical methods

Analysis of inhomogeneities on wafers by the integral transform method

Yu. A. Eremin, V. I. Ivakhnenko

Lomonosov Moscow State University
Full-text PDF (1710 kB) Citations (3) English version article
Received: 31.03.2000
English version:
Differential Equations, 2000, Volume 36, Issue 9, Pages 1370–1380
DOI: https://doi.org/10.1007/BF02754310
Bibliographic databases:
Document Type: Article
UDC: 519.63
Language: Russian
Citation: Yu. A. Eremin, V. I. Ivakhnenko, “Analysis of inhomogeneities on wafers by the integral transform method”, Differ. Uravn., 36:9 (2000), 1238–1247; Differ. Equ., 36:9 (2000), 1370–1380
Citation in format AMSBIB
\Bibitem{EreIva00}
\by Yu.~A.~Eremin, V.~I.~Ivakhnenko
\paper Analysis of inhomogeneities on wafers by the integral transform method
\jour Differ. Uravn.
\yr 2000
\vol 36
\issue 9
\pages 1238--1247
\mathnet{http://mi.mathnet.ru/de10220}
\mathscinet{https://mathscinet.ams.org/mathscinet-getitem?mr=1838589}
\transl
\jour Differ. Equ.
\yr 2000
\vol 36
\issue 9
\pages 1370--1380
\crossref{https://doi.org/10.1007/BF02754310}
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  • https://www.mathnet.ru/eng/de10220
  • https://www.mathnet.ru/eng/de/v36/i9/p1238
    • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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    Abstract page:220
    Full-text PDF :114
    References:3
     
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