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This article is cited in 7 scientific papers (total in 7 papers)
Surfaces, Electron and Ion Emission
Study of Si and C adatoms and SiC clusters on the silicon surface by the molecular dynamics method
V. S. Kharlamovab, Yu. V. Trushinab, E. E. Zhurkinc, M. N. Lubovb, I. Petsol'dtd a Ioffe Institute, St. Petersburg
b Saint Petersburg Physics and Technology Centre for Research and Education
c St. Petersburg Polytechnic University
d Center for Micro- and Nanotechnologies, Technical University Ilmenau,
D-98684, Ilmenau, Germany
Abstract:
Individual Si and C adatoms, as well as SiC clusters, on a Si surface are simulated by the molecular dynamics method in the course of investigation of the initial stages of formation of a SiC layer on silicon with the help of molecular beam epitaxy. The potential energy surfaces for Si and C adatoms on the (2 $\times$ 1) reconstructed Si(001) surface and on the nonreconstructed Si(111) surface, as well as on the Si(111) surface with a SiC cluster, are calculated and analyzed. The values of migration barriers for adatoms on these surfaces are calculated. The effect of the SiC cluster on deformation of the surface region of Si(111) and on the migration of adatoms is investigated. The deep minima observed on the potential energy surfaces immediately above a cluster and at its boundaries can trap diffusing adatoms. The distributions of stresses and strains in the silicon lattice under a cluster on the surface are studied and described.
Received: 28.11.2007
Citation:
V. S. Kharlamov, Yu. V. Trushin, E. E. Zhurkin, M. N. Lubov, I. Petsol'dt, “Study of Si and C adatoms and SiC clusters on the silicon surface by the molecular dynamics method”, Zhurnal Tekhnicheskoi Fiziki, 78:11 (2008), 104–118; Tech. Phys., 53:11 (2008), 1490–1503
Linking options:
https://www.mathnet.ru/eng/jtf10262 https://www.mathnet.ru/eng/jtf/v78/i11/p104
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