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Zhurnal Tekhnicheskoi Fiziki, 2024, Volume 94, Issue 2, Pages 261–266
DOI: https://doi.org/10.61011/JTF.2024.02.57081.281-23
(Mi jtf6711)
 

Physics of nanostructures

Resistance change of thin films Bi$_2$Se$_3$ and heterostructures Bi$_2$Se$_3$ on graphene under tensile deformation

N. A. Nebogatikovaa, I. V. Antonovaab, R. A. Sootsa, K. A. Kokhc, E. S. Klimovac, V. A. Volodinad

a Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, 630090 Novosibirsk, Russia
b Novosibirsk State Technical University, 630087 Novosibirsk, Russia
c Sobolev Institute of Geology and Mineralogy, Siberian Branch of the Russian Academy of Sciences, 630058 Novosibirsk, Russia
d Novosibirsk State University, 630090 Novosibirsk, Russia
DOI: https://doi.org/10.61011/JTF.2024.02.57081.281-23
Abstract: The creation of vertical Bi$_2$Se$_3$ heterostructures based on graphene, obtained by physical vapor deposition, leads not only to a more advanced structure and conductivity of the Bi$_2$Se$_3$ layer, but also to improved mechanical properties. Films Bi$_2$Se$_3$ with a thickness of 20–40 nm based on CVD graphene slightly changed their resistance under tensile deformations created during bending of the structures. It was found that the resistance increases by only 20–30% when stretched to 3.3%. When Bi$_2$Se$_3$ is grown on a layer of printed graphene, a film Bi$_2$Se$_3$ is formed that is inhomogeneous in area and thickness, cracking at strains greater than 1.5%.
Keywords: vertical heterostructures, Bi$_2$Se$_3$ on graphene, tensile deformations, change in resistance.
Funding agency Grant number
Ministry of Science and Higher Education of the Russian Federation 075-15-2020-797
13.1902.21.0024
The work was supported by the Ministry of Science and Higher Education of the Russian Federation (075-15-2020-797, 13.1902.21.0024).
Received: 13.11.2023
Revised: 08.12.2023
Accepted: 18.12.2023
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: N. A. Nebogatikova, I. V. Antonova, R. A. Soots, K. A. Kokh, E. S. Klimova, V. A. Volodin, “Resistance change of thin films Bi$_2$Se$_3$ and heterostructures Bi$_2$Se$_3$ on graphene under tensile deformation”, Zhurnal Tekhnicheskoi Fiziki, 94:2 (2024), 261–266
Citation in format AMSBIB
\Bibitem{NebAntSoo24}
\by N.~A.~Nebogatikova, I.~V.~Antonova, R.~A.~Soots, K.~A.~Kokh, E.~S.~Klimova, V.~A.~Volodin
\paper Resistance change of thin films Bi$_2$Se$_3$ and heterostructures Bi$_2$Se$_3$ on graphene under tensile deformation
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 2024
\vol 94
\issue 2
\pages 261--266
\mathnet{http://mi.mathnet.ru/jtf6711}
\elib{https://elibrary.ru/item.asp?id=60019970}
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