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Zhurnal Tekhnicheskoi Fiziki, 1987, Volume 57, Issue 9, Pages 1831–1833 (Mi jtf892)  
Brief Communications

CHARACTERISTICS OF BRAGG REFLECTION FROM THE MULTILAYERED TITANIUM-SILICON STRUCTURE NEAR THE K-EDGE OF SILICON ABSORPTION

V. V. Kondratenko, I. F. Mikhaĭlov, A. G. Ponomarenko, A. V. Steblenko

Khar'kov Polytechnical Institute
Full-text PDF (389 kB)
Received: 11.07.1986
Bibliographic databases:
Document Type: Article
UDC: 548.73/.75 : 539.24/.27
Language: Russian
Citation: V. V. Kondratenko, I. F. Mikhaǐlov, A. G. Ponomarenko, A. V. Steblenko, “CHARACTERISTICS OF BRAGG REFLECTION FROM THE MULTILAYERED TITANIUM-SILICON STRUCTURE NEAR THE K-EDGE OF SILICON ABSORPTION”, Zhurnal Tekhnicheskoi Fiziki, 57:9 (1987), 1831–1833
Citation in format AMSBIB
\Bibitem{KonMikPon87}
\by V.~V.~Kondratenko, I.~F.~Mikha{\v\i}lov, A.~G.~Ponomarenko, A.~V.~Steblenko
\paper CHARACTERISTICS OF BRAGG REFLECTION FROM THE MULTILAYERED
TITANIUM-SILICON STRUCTURE NEAR THE K-EDGE OF SILICON ABSORPTION
\jour Zhurnal Tekhnicheskoi Fiziki
\yr 1987
\vol 57
\issue 9
\pages 1831--1833
\mathnet{http://mi.mathnet.ru/jtf892}
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