|
Спектроскопия, взаимодействие с излучениями
Synchrotron radiation photoemission study of the electronic structure of the ultrathin K/AlN interface
G. V. Benemanskayaa, S. N. Timoshnevb, G. N. Iluridzec, T. A. Minashvilic a Ioffe Institute, 194021 St. Petersburg, Russia
b Alferov University, 194021 St. Petersburg, Russia
c Georgian Technical University, 0175 Tbilisi, Georgia
Аннотация:
The electronic structure of the clean AlN surface and the ultrathin K/AlN interface has been studied in situ by synchrotron-based photoelectron spectroscopy using the photon energies in the range of 100–650 eV. The effect of K adsorption was studied. Changes in the valence band and in the Al $2p$, N $1s$, and K $3p$ core levels spectra have been investigated using K submonolayer deposition. Modification of the surface electronic structure of the AlN caused by K adsorption is found to originate from the local interaction of N surface atoms and K adatoms. As a results the suppression of intrinsic surface state and appearance of a new induced state are observed. It was found the K-induced electron redistribution effect that causes the positive energy shift of N $1s$ surface peak and increasing N-ionicity.
Ключевые слова:
III-nitrides, electronic structure, surface states, metal-III-nitride interfaces, photoelectron spectroscopy.
Поступила в редакцию: 25.02.2022 Исправленный вариант: 25.03.2022 Принята в печать: 25.03.2022
Образец цитирования:
G. V. Benemanskaya, S. N. Timoshnev, G. N. Iluridze, T. A. Minashvili, “Synchrotron radiation photoemission study of the electronic structure of the ultrathin K/AlN interface”, Физика и техника полупроводников, 56:6 (2022), 541
Образцы ссылок на эту страницу:
https://www.mathnet.ru/rus/phts7054 https://www.mathnet.ru/rus/phts/v56/i6/p541
|
| Статистика просмотров: |
| Страница аннотации: | 48 | | PDF полного текста: | 12 |
|