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Fizika i Tekhnika Poluprovodnikov, 2011, Volume 45, Issue 6, Pages 765–769
(Mi phts8557)
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This article is cited in 30 scientific papers (total in 30 papers)
Surface, interfaces, thin films
Physical properties of SnS thin films fabricated by hot wall deposition
S. A. Bashkirov, V. F. Gremenok, V. A. Ivanov Scientific-Practical Materials Research Centre of NAS of Belarus
Abstract:
The dependence of the microstructure and optical properties of SnS thin films fabricated by hot wall deposition onto glass substrates on the deposition conditions is studied. Phase and elemental composition, surface morphology, and transmission spectra of the obtained films are investigated within the wavelength range 400–2500 nm. The single-phase films feature near-stoichiometric elemental composition and a high degree of preferential orientation in the (040) plane. The optical band gap for direct transitions is 1.07–1.27 eV, depending on film thickness.
Received: 18.11.2010 Accepted: 01.12.2010
Citation:
S. A. Bashkirov, V. F. Gremenok, V. A. Ivanov, “Physical properties of SnS thin films fabricated by hot wall deposition”, Fizika i Tekhnika Poluprovodnikov, 45:6 (2011), 765–769; Semiconductors, 45:6 (2011), 749–752
Linking options:
https://www.mathnet.ru/eng/phts8557 https://www.mathnet.ru/eng/phts/v45/i6/p765
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| Statistics & downloads: |
| Abstract page: | 106 | | Full-text PDF : | 75 |
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