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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2023, Volume 49, Issue 1, Pages 35–38
DOI: https://doi.org/10.21883/PJTF.2023.01.54056.19286 (Mi pjtf6887) 		 
This article is cited in 1 scientific paper (total in 1 paper)

Low-energy ion scattering with additional mass separation: instrumentation and application

A. B. Tolstoguzovabc, S. Guseva, D. J. Fub

a Ryazan State Radio Engineering University, Ryazan, Russia
b Key Laboratory of Artificial Micro- and Nanostructures of Ministry of Education and Hubei Key Laboratory of Nuclear Solid Physics, School of Physics and Technology, Wuhan University, Wuhan, China
c Centre for Physics and Technological Research, Universidade Nova de Lisboa, Caparica, Portugal
Full-text PDF (276 kB) Citations (1)
DOI: https://doi.org/10.21883/PJTF.2023.01.54056.19286
Abstract: Hardware implementation and application of the combined energy and mass spectrometric analysis of backscattered and sputtered ions are discussed. For a ternary jewelry alloy contained Au, Ag and Cu, it was shown that this method is able improving analytical sensitivity by suppressing the background related to sputtered ions, and with heavy Ar$^+$ ions to obtain information on the surface condition of a lanthanum sample and to detect backscattered and sputtered Ar$^{2+}$ ions on this surface.
Keywords: ion scattering, ion sputtering, mass spectrometric analysis, energy spectra, lanthanum.
Funding agency Grant number
Ministry of Science and Higher Education of the Russian Federation FSSN-2020-0003
This study was supported in part under state assignment of the Ministry of Science and Higher Education of the Russian Federation (FSSN-2020-0003).
Received: 22.06.2022
Revised: 03.11.2022
Accepted: 07.11.2022
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. B. Tolstoguzov, S. Gusev, D. J. Fu, “Low-energy ion scattering with additional mass separation: instrumentation and application”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 49:1 (2023), 35–38
Citation in format AMSBIB
\Bibitem{TolGusFu23}
\by A.~B.~Tolstoguzov, S.~Gusev, D.~J.~Fu
\paper Low-energy ion scattering with additional mass separation: instrumentation and application
\jour Pisma v Zhurnal Tekhnicheskoi Fiziki
\yr 2023
\vol 49
\issue 1
\pages 35--38
\mathnet{http://mi.mathnet.ru/pjtf6887}
\crossref{https://doi.org/10.21883/PJTF.2023.01.54056.19286}
\elib{https://elibrary.ru/item.asp?id=50250420}
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    • This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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